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Abstract
This study investigated tantalite mineralisation
in the Laisamis area, Kenya, using integrated geophysical and geochemical
methods. Electrical resistivity surveying employed the Schlumberger
configuration along four 400 m profiles with 10 m spacing. Resistivity
pseudosections revealed that mineralized zones occur within conductive layers
ranging from 12–186 O · m in the upper 30 m of the subsurface, while high-resistivity bedrock
of greater than 2,000 O · m marks the lower boundary of mineralisation.
These conductive anomalies correspond to weathered troughs and fractured zones
within pegmatite bodies hosting tantalite deposits, which are the primary
source of tantalum. Geochemical analysis via X-ray fluorescence (XRF)
spectrometry confirmed concentrations above 43% in six of ten rock samples,
positioning them as high-grade ores. Niobium, iron, and manganese were present
as associated elements, with low minor element content indicating clean mineral
assemblages favourable for processing. The combination of resistivity imaging
and XRF data successfully delineated the spatial extent, depth, and grade of
mineralisation. This study demonstrates that integrated geophysical and
geochemical methods offer a non-invasive, cost-effective approach for exploring
critical metals in underdeveloped regions, supporting sustainable resource
development in Kenya.
Keywords: Tantalite, Resistivity, Schlumberger, Pegmatite,
Pseudosection, X-ray fluorescence.